Compton Scattering in Electron Excited Energy Dispersive X-ray Spectra
نویسندگان
چکیده
منابع مشابه
Compton scattering artifacts in electron excited X-ray spectra measured with a silicon drift detector.
Artifacts are the nemesis of trace element analysis in electron-excited energy dispersive X-ray spectrometry. Peaks that result from nonideal behavior in the detector or sample can fool even an experienced microanalyst into believing that they have trace amounts of an element that is not present. Many artifacts, such as the Si escape peak, absorption edges, and coincidence peaks, can be traced ...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2010
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927610060137